《電子技術(shù)應(yīng)用》
您所在的位置:首頁 > 其他 > 設(shè)計(jì)應(yīng)用 > 基于DSP增益可控的光刻機(jī)測(cè)高電路的設(shè)計(jì)研究
基于DSP增益可控的光刻機(jī)測(cè)高電路的設(shè)計(jì)研究
2021年電子技術(shù)應(yīng)用第8期
趙英偉,郝曉亮,張文雅,馬培圣,文黎波
中國電子科技集團(tuán)公司第十三研究所,河北 石家莊050051
摘要: 介紹了激光三角法高度測(cè)量技術(shù)和基于數(shù)字信號(hào)處理器DSP與線陣CCD的激光高度測(cè)量系統(tǒng)。采用比例恒流源和鏡像恒流源組合,設(shè)計(jì)了輸出功率穩(wěn)定可調(diào)的激光二極管驅(qū)動(dòng)電路和線陣CCD的驅(qū)動(dòng)電路,借助DSP定時(shí)器周期調(diào)節(jié)靈活的優(yōu)點(diǎn),方便地調(diào)節(jié)光積分時(shí)間來提高信號(hào)質(zhì)量。針對(duì)光刻工藝中不同的測(cè)量對(duì)象表面的光學(xué)特征,自動(dòng)進(jìn)行激光二極管增益控制和光積分時(shí)間調(diào)節(jié),提高測(cè)量的適應(yīng)性和測(cè)量效率。
中圖分類號(hào): TN405
文獻(xiàn)標(biāo)識(shí)碼: A
DOI:10.16157/j.issn.0258-7998.201252
中文引用格式: 趙英偉,郝曉亮,張文雅,等. 基于DSP增益可控的光刻機(jī)測(cè)高電路的設(shè)計(jì)研究[J].電子技術(shù)應(yīng)用,2021,47(8):120-122,132.
英文引用格式: Zhao Yingwei,Hao Xiaoliang,Zhang Wenya,et al. Design and research of height measuring circuit based on DSP with adjustable gain for the lithography machine[J]. Application of Electronic Technique,2021,47(8):120-122,132.
Design and research of height measuring circuit based on DSP with adjustable gain for the lithography machine
Zhao Yingwei,Hao Xiaoliang,Zhang Wenya,Ma Peisheng,Wen Libo
The 13th Research Institute of China Electronics Technology Group Coporation,Shijiazhuang 050051,China
Abstract: This article briefly introduces the laser triangulation height measurement technology, and the laser height measurement system based on digital signal processor DSP and linear array CCD. Using a combination of proportional constant current source and mirror constant current source, a laser diode drive circuit with stable and adjustable output power is designed. The driving circuit of the linear CCD is given. With the advantage of flexible adjustment of the DSP timer period, it is convenient to adjust the light integration time to improve the signal quality.According to the optical characteristics of different measuring object surfaces, the laser diode gain control and light integration time adjustment are automatically performed to improve the adaptability and efficiency of measurement.
Key words : laser triangulation;linear array CCD;digital signal processor DSP;lithography machine

0 引言

    光刻工藝是大規(guī)模集成電路生產(chǎn)中的關(guān)鍵工藝。為了在晶圓上獲得高分辨率的光刻圖形,光刻設(shè)備必須盡可能精確地將晶圓平行放置到鏡頭的焦平面上。

    如果晶圓在工件臺(tái)上的高度出現(xiàn)變化,會(huì)導(dǎo)致聚焦偏差,引起束斑或光斑增大、加工的線條模糊,曝光圖形出現(xiàn)拼接缺陷等問題[1]

    所以高度測(cè)量系統(tǒng)要能夠精確測(cè)量,能夠?qū)Σ煌木A厚度、膠層厚度或者溫度和氣壓所引起的聚焦位置變化等因素的影響進(jìn)行補(bǔ)償[2]。




本文詳細(xì)內(nèi)容請(qǐng)下載:http://ihrv.cn/resource/share/2000003714




作者信息:

趙英偉,郝曉亮,張文雅,馬培圣,文黎波

(中國電子科技集團(tuán)公司第十三研究所,河北 石家莊050051)




wd.jpg

此內(nèi)容為AET網(wǎng)站原創(chuàng),未經(jīng)授權(quán)禁止轉(zhuǎn)載。