中圖分類號：TP212 文獻(xiàn)標(biāo)志碼：A DOI: 10.16157/j.issn.0258-7998.234633 中文引用格式： 付利莉，董雪鶴，牛長勝，等. 一種電子標(biāo)簽的加速壽命試驗(yàn)可靠性預(yù)測方法研究[J]. 電子技術(shù)應(yīng)用，2024，50(4)：92-96. 英文引用格式： Fu Lili，Dong Xuehe，Niu Changsheng，et al. The research on accelerated life test reliability prediction method for electronic tags[J]. Application of Electronic Technique，2024，50(4)：92-96.
The research on accelerated life test reliability prediction method for electronic tags
Fu Lili1，2，Dong Xuehe1，2，Niu Changsheng1，2，Liang Zhaoqing1，2，Bai Xuesong1，2，Cui Lan1，2
1.Beijing Chip Microelectronics Technology Co.， Ltd.； 2.State Grid Corporation of China
Abstract： With the continuous development of microelectronic components design capability and process technology, the reliability and life of the device is increasing. Radio Frequency Identification (RFID) tags are characterized by high demand, wide range of applications, and wide geographical (use temperature) span, which puts high demands on the reliability of the product, and it is of great practical significance to study the degradation characteristics at high and low temperatures. Based on Arrhenius theory, this paper proposes a method to quickly calculate the activation energy of electronic tags, to carry out a short time life acceleration test on electronic tags, to predict the life situation through the degradation data of the tag's electric field strength performance, to quickly solve the value of activation energy of the electronic tags, and then to calculate the acceleration factor under different temperature conditions, which provides a theoretical basis for the accelerated test time for electronic tags under different life evaluation standards.
Key words : lifetime acceleration；activation energy；degradation of performance；quick calculation
