《電子技術(shù)應(yīng)用》
您所在的位置:首頁 > 電子元件 > 設(shè)計(jì)應(yīng)用 > 大功率IGBT器件內(nèi)部載流子控制方法綜述
大功率IGBT器件內(nèi)部載流子控制方法綜述
2020年電子技術(shù)應(yīng)用第6期
鄒 密1,馬 奎2
1.貴州大學(xué) 大數(shù)據(jù)與信息工程學(xué)院,貴州 貴陽550025; 2.貴州省微納電子與軟件技術(shù)重點(diǎn)實(shí)驗(yàn)室,貴州 貴陽550025
摘要: 絕緣柵雙極晶體管(IGBT)的內(nèi)部載流子控制方法對(duì)器件的導(dǎo)通狀態(tài)電壓降、關(guān)斷損耗、SOA、熱可靠性和瞬態(tài)穩(wěn)定性等器件性能至關(guān)重要。已經(jīng)報(bào)道的許多載流子控制方法都側(cè)重于發(fā)射極(或陰極)、集電極(或陽極)和漂移區(qū)的設(shè)計(jì)。重點(diǎn)介紹了當(dāng)前和未來幾代IGBT的載流子控制方法。回顧發(fā)射極、集電極和漂移區(qū)的設(shè)計(jì)如何影響正向壓降和關(guān)斷能量損耗之間的權(quán)衡。最后,總結(jié)展望未來大功率IGBT器件內(nèi)部載流子控制方法的發(fā)展趨勢。
中圖分類號(hào): TN389
文獻(xiàn)標(biāo)識(shí)碼: A
DOI:10.16157/j.issn.0258-7998.200085
中文引用格式: 鄒密,馬奎. 大功率IGBT器件內(nèi)部載流子控制方法綜述[J].電子技術(shù)應(yīng)用,2020,46(6):21-27.
英文引用格式: Zou Mi,Ma Kui. Survey of internal carrier control methods for high power IGBTs[J]. Application of Electronic Technique,2020,46(6):21-27.
Survey of internal carrier control methods for high power IGBTs
Zou Mi1,Ma Kui2
1.College of Big Data and Information Engineering,Guizhou University,Guiyang 550025,China; 2.Key Laboratory of Micro-Nano-Electronics of Guizhou Province,Guiyang 550025,China
Abstract: Internal carrier control methods for Insulated Gate Bipolar Transistors(IGBTs) are critical for the device performances such as on-state voltage drop, turn-off losses, SOA, thermal reliability and transient ruggedness, etc. Numerous carrier control methods focusing on the design of the emitter(or cathode), collector(or anode), and drift regions have been reported. This paper focuses on the carrier control methods of current and future generations of IGBTs.In particular, the designs of the emitter, collector, and drift regions and how they affects the trade-off between the forward voltage drop and the turn-off energy loss are reviewed. Finally, the development trend of carrier control in high-power IGBT devices is summarized look forward to.
Key words : IGBT; carrier control methods; device performance; turn-off losses; on-state voltage drop

0 引言

    在過去的三十年,絕緣柵雙極晶體管(Insulated Gate Bipolar Transistors,IGBT)已發(fā)展成為現(xiàn)代功率半導(dǎo)體器件的主力器件之一。和功率MOSFET相比,IGBT有工作電壓高、工作電流大、驅(qū)動(dòng)功率小等優(yōu)點(diǎn),被廣泛應(yīng)用于電機(jī)控制、不間斷電源(UPS)、空調(diào)、機(jī)器人、焊機(jī)和汽車電子等中頻應(yīng)用領(lǐng)域。




論文詳細(xì)內(nèi)容請(qǐng)下載http://ihrv.cn/resource/share/2000002835




作者信息:

鄒  密1,馬  奎2

(1.貴州大學(xué) 大數(shù)據(jù)與信息工程學(xué)院,貴州 貴陽550025;

2.貴州省微納電子與軟件技術(shù)重點(diǎn)實(shí)驗(yàn)室,貴州 貴陽550025)

此內(nèi)容為AET網(wǎng)站原創(chuàng),未經(jīng)授權(quán)禁止轉(zhuǎn)載。